Nidec SV TCL will be participating during MEPTEC’s Too Hot to Test Virtual Event February 9-11. Join us during this 3-day, FREE online conference which will cover the challenges of high power IC test and how test providers like Nidec SV TCL are rising to meet these challenges.

Attend our presentation, A Revolutionary MEMS RF Hybrid Probe Card on February 10. For more information on this event go to Too Hot to Test 2021 | MEPTEC.