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  • Direct Dock Probe Cards

    Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.

    Nidec SV TCL offers many probing solutions aligning with this new testing paradigm including TrioTM traditional vertical, LogicTouchTM MEMS vertical, and SpringTouchTM spring-pin technologies. Our turnkey services are ideal for direct dock, we can handle your entire project from PCB design to probe card assembly and everything in between.

         • Turnkey Services Available
            - PCB/MLO Design & Fab
            - Component Assembly
            - Probe Card Assembly
            - PCA
         • Applications Supported
            - Digital
            - SOC
            - RF

    Contact your Nidec SV TCL Representative so we can help you find the right Direct Dock product for your vertical testing needs.